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Princeton Applied Research Announces the New Scanning Droplet System Module
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Release Date: Thursday, May 15, 2008
Release Date: May 15, 2008
Oak Ridge, TN - Princeton Applied Research announces the introduction of the Scanning Droplet System, Model SDS370, to compliment its range of scanning probe instrumentation.
The scanning droplet technique confines a liquid in contact with a sample surface in order to measure electrochemical and corrosion reactions over the limited region where the droplet is in contact with the sample. This offers the ability to spatially resolve electrochemical activity and to confine it exclusively to a quantifiable area of the sample.
The SDS370 scanning droplet system allows a spatially resolved, in-situ investigation by standard electrochemical techniques such as line scans, area maps, potentiostatic pulse steps and open circuit measurements.
The SDS370 Module is used in conjunction with the M370 x,y,z positioning system and benefits from highly accurate optical encoders providing precise closed loop feedback positioning over the full scan length and offers higher stability and measurement precision.
Application areas for the SDS techniques include:
- Characterization of Surface Oxides
- Investigation of Coatings
- Characterization of ISFETs
- Investigation of Pitting Corrosion
- Localized Corrosion Versus Flow Rate
The SDS370 expands the range of scanning electrochemical techniques available from Princeton Applied Research for research and industrial applications and compliments the SVET, LEIS, SKP, SECM and OSP modules.
For more information please contact Rob Roberts, Product Manager, Princeton Applied Research, 801 S. Illinois Avenue, Oak Ridge, TN 37830 : 800-366-2741 or visit the company website: www.princetonappliedresearch.com
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