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The Model 370 Scanning Electrochemical Workstation is a new concept in Scanning Probe Electrochemistry designed for ultra-high resolution, spatially resolved electrochemical and non-contact surface topography measurements.
The Model 370 is a modular configurable system which will perform all the Scanning Probe Electrochemical techniques plus laser based non-contact surface profiling:
- Scanning Electrochemical Microscopy (SECM)
- Scanning Kelvin Probe (SKP)
- Scanning Vibrating Electrode Technique (SVET)
- Localized Electrochemical Impedance Spectroscopy (LEIS)
- Scanning Droplet System (SDS)
- Non-Contact Surface Profiling (OSP)
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SVP370
Scanning Vibrating Electrode System
The Scanning Vibrating Electrode Technique (SVET) operates with a non-intrusive scanning, vibrating probe measuring and mapping the electric field generated in a plane above the surface of an electrochemically active sample. This enables the user to map and quantify local electrochemical and corrosion events in real time.
- Non-Intrusive AC electrochemical activity measurement
- Sensitivity achieved via phase Sensitive detection
- Evaluate passivation/repassivation characteristics
- Identify and quantify electrochemically active pin-hole coating defects
- Requires 370 base scanning controller
- Measure localized corrosion events of less than 5µA/cm2
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SKP370
Scanning Kelvin Probe System
The Scanning Kelvin Probe (SKP) is a non-contact, non-destructive instrument designed to measure the surface work function difference between conducting, coated, or semi-conducting materials and a sample probe. The technique operates using a vibrating capacitance probe, and through a swept backing potential, the work fuction difference is measured between the scanning probe reference tip and sample surface. The work function can be directly correlated to the surface condition.
- Non-contact, non-destructive surface work function determination
- Measure and image localized work-function difference at the meV level
- Quantify corrosive potentials in a variety of controlled atmospheres
- Ideal for semiconductor, filliform corrosion, sensor, and paint/coating applications
- Requires 370 base scanning controller
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LEIS370
Localized Electrochemical Impedance System
The Localized Electrochemical Impedance System (LEIS370) allows spatially resolved impedance measurements to be made, combining established principles of EIS measurements with scanning probe technology.
- Fixed-point, multiple frequency measurement
- Fixed-frequency, two dimensional scan
- Fixed-frequency, single line scan
- Maximum scan range of 7 x 7cm
- Provide spatially resolved electrochemical impedance measurements for the surface of coatings, corrosion inhibitors, localized corrosion, biofilms, delamination studies, and scratch test
- Requires 370 base scanning controller
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SDS370
Scanning Droplet System
The Scanning Droplet System is a technique which confines a liquid in contact with a sample surface in order to measure electrochemical and corrosion reactions over a limited region where the droplet is actually in contact with the sample. This offers the ability to spatially resolve electrochemical activity and to confine it exclusively to a quantifiable area of the sample.
- Measure electrochemical and corrosion reactions over a limited region where a droplet is in contact with the sample
- Manually controlled 4-channel peristaltic pump to regulate the flow of liquid
- Perform common electrochemical techniques such as cyclic voltammetry, Tafel plots, potentiodynamic polarizations, chronoamperometry and chronopotentiometry
- Ideal for characterization of surface oxides, investigation of coatings, characterization of ISFETs, Investigation of pitting corrosion, and localized corrosion versus flow rate
- Requires 370Base Scanning Controller
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OSP370
Non-Contact Surface Profiling
Utilizing a non-contact laser displacement sensor, the OSP370 module allows fast and accurate non-contact surface measurement to a very high accuracy. Features of less than one micrometer can be imaged and measured over a height measurement range of 10mm without touching the sample surface.
- Make sub-micron resolution height measurements and generate 3D surface profiles of sample surface profiles of sample surfaces using a highly accureate laser displacement sensor
- Measure surface roughness, topography features, and data to alter sample probe height in any of the other scanning modules (SKP, SVET, LEIS)
- Requires 370 base scanning controller
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SECM370
Scanning Electrochemical Microscope System
The SECM370 is a precision scanning miro-eletrode system which can be used to monitor (or impose) current flowing between a micro-electrode and a specimen surface in solution at extremely high spatial resolutions. It can be used to examine, analyze, or alter the surface chemistry of a sample solution. This equipment has many potential applications in the study of fundamentals of surface reactions in fields as diverse as corrosion science to enzyme stability studies.
- Two isolated PG580 potentiostats are supplied, which can be arranged as a bipotentiostat capable of both feedback and Generator-Collector modes of operation
- Constant-Height and Constant-Current operation are included - Constant-Distance is available with OSP module
- Probes of 25-, 15-, and 10-micron diameter Pt available - Minimum RG ratio = 10
- Approach curves, Line and Area Maps, as well as fundamental electrochemical techniques (e.g., Cyclic Voltammetry)
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