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VersaSCAN
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Electrochemical Scanning Systems

VersaSCAN
Electrochemical Scanning System

The VersaSCAN is a single platform capable of providing spatial resolution to both electrochemical and materials-based measurements.  Each VersaSCAN is based on a common high-resolution, long-travel, closed-loop positioning system mounted to a vibration-resistant optical base.  Different auxiliary pieces are mounted to the positioning system.  These ancillary pieces (e.g., an electrometer, piezo vibration unit, or a laser sensor) provide functionality to the positioning system for different scanning probe experiments.  VersaSTAT potentiostats and Signal Recovery Lock-in Amplifiers are integrated via ethernet control to make accurate measurements of these small signals.

SECM

  • Scanning Electrochemical Microscopy (SECM)
  • Scanning Vibrating Electrode Technique (SVET)
  • Scanning Kelvin Probe (SKP)
  • Localized Electrochemical Impedance Spectroscopy (LEIS)
  • Scanning Droplet System (SDS)
  • Non-Contact Surface Profiling (OSP)

Each technique uses a different measurement probe that is positioned close, but not in conact to the sample.  After a measurement is made at the probe, its position is incremented.  Plotting recorded parameter versus probe position creates a data map.  Depending on the technique, this map could represent local electrochemical current, impedance, relative work function, or topography.

 


 SECM  VersaSCAN SECM
Scanning ElectroChemical Microscopy

The VersaSCAN SECM integrates the Base with two VersaSTAT Potentiostats and an ultramicroelectrode probe with a specific tapered polish.  SECM is a versatile technique adding spatial resolution to applications such as kinetics, biological sensors, catalyst, and corrosion mechanisms.

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  • Compatible Potentiostats:  VersaSTAT 3F and either a VersaSTAT 3 / 3F /4

  • Capable of Approach Curves experiments and both Feedback Mode and Generator-Collector Mode imaging modes

  • Can perform Constant-Distance operation in conjunction with a topographic measurement technique, typically OSP

  • VersaSTATs are additionally capable of a vast suite of standard non-scanning electrochemical tests depending on their specific software model 


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 SVET  VersaSCAN SVET
Scanning Vibrating Electrode Technique


The VersaSCAN SVET integrates the Base with a Signal Recovery Lock-in Amplifier, a piezo-based vibration module, an electrometer and a single wire- based probe.  The SVET technique measures voltage-drop in solution.  This voltage-drop exists in electrolyte due to local current activity at a sample surface.  SVET adds spatial resolution to applications such as non-uniform corrosion events, such as pits, welds and galvanic couples.  Additionally, there are biological applications to SVET.
  • Compatible Lock-in Amplifier:  Signal Recovery 7230

  • Capable of both single Line Scans and Area Scans

  • Capable of Time-Resolved Imaging when programmed as a sequence

  • Can perform Constant-Distance operation in conjunction with a topographic measurement technique, typically OSP

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 LEIS VersaSCAN LEIS
Localized Electrochemical Impedance System


The VersaSCAN LEIS integrates the Base with a VersaSTAT 3F with Differential Auxiliary Option , an electrometer and a dual-element probe.  The LEIS technique calculates local impedance by determining the ratio of AC voltage applied to the sample and local AC current measured at the probe in solution.  LEIS adds spatial resolution to applications such as organic coatings, bare metal corrosion, and any application that benefits from the added information content of AC-techniques.
  • Compatible Potentiostats:  VersaSTAT 3F with Differential Auxiliary Option

  • Capable of running both fixed-frequency /swept position plots for data maps and fixed-position / swept-frequency plots Bode or Nyquist  plots

  • Capable of Time-Resolved Imaging when programmed as a sequence

  • Can perform Constant-Distance operation in conjunction with a topographic measurement technique, typically OSP.

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 SKP 

VersaSCAN SKP
Scanning Kelvin Probe


The VersaSCAN SKP integrates the Base with a Signal Recovery Lock-in Amplifier, a piezo-based vibration module, an electrometer and a tungsten-wire probe.  The SKP technique measures relative work function difference between the measurement probe and that position on the sample.  This is a non-destructive technique typically ran in ambient or humidified air, absent of electrolyte.  Relative Work Function has been demonstrated to be able to be correlated to Corrosion Potential (Ecorr).  SKP adds spatial resolution to applications such as materials, semi-conductors, and corrosion of metals…even with coatings on them.

  • Compatible Lock-in Amplifier:  Signal Recovery 7230

  • Capable of Topography Mode experiments to measure and set probe-to-sample distance

  • Can perform Constant-Distance operation in conjunction with the Topography Mode experiments, using the same probe.

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 SDC  VersaSCAN SDC
Scanning Droplet Cell

The VersaSCAN SDC integrates the Base with a VersaSTAT, a PTFE machined head, and a peristaltic pump.  The SDC technique confines the electrochemical measurement to the small droplet of electrolyte, defining the area of the electrode/electrolyte interface.  SDC adds spatial resolution to applications such as kinetics, corrosion, fluid-flow studies, and any application where a small area on a sample needs to be investigated without cutting the sample or subjecting areas to different electrolyte exposure times.
  • Compatible Potentiostats:  VersaSTAT 3 / 3F /4

  • Capable of running both constant bias/swept position plots for data maps and fixed-position/ dynamic signal plots for Cyclic Voltammetry, Tafel, EIS, etc.

  • Capable of running experiments with flowing or static drop of electrolyte.Click Here

 


 OSP  VersaSCAN OSP
Non-Contact Optical Surface Profiling

The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor.  The OSP technique uses diffuse reflection mechanism to measure topography of a sample.  OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.

 

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